A Low-Cost and Triple-Node-Upset Self-Recoverable Latch Design with Low Soft Error Rate

Licai Hao, Lang Tian, Hao Wang, Shiyu Zhao,Qiang Zhao,Chunyu Peng,Chenghu Dai, Zhitin Lin,Xiulong Wu

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS（2025）

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Polarity design,radiation-hardened latch,soft error rate (SER),soft error rate (SER),triple node upset,triple node upset,triple node upset

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