Investigation of Threshold Voltage Instability in P-Gan Gate HEMTs under Surge Current Stress

Xiaoming Wang,Yu Shi, David Zhou, Haizhao Zhi,Yun Xia, Yuxi Wan, Ruize Sun,Xinghuan Chen,Wanjun Chen,Bo Zhang

2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)（2024）

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p-GaN gate HEMTs,surge current,surge voltage,VTH instability,trapping effect

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