A Simple Characterization Method for Parasitic Capacitance Extraction of SiC Power MOSFETs Integrated Half-Bridge Configuration
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS（2024）
关键词
Characterization,half-bridge configuration,parasitic capacitance,power metal-oxide-semiconductor field-effect transistor (MOSFET),S-parameter,Characterization,half-bridge configuration,parasitic capacitance,power metal-oxide-semiconductor field-effect transistor (MOSFET),S-parameter
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