Understanding and Removing FIB Artifacts in Metallic TEM Samples Using Flash Electropolishing

Danny J. Edwards,Alan Schemer-Kohrn,Matt Olszta,Ramprashad Prabhakaran,Yuanyuan Zhu, Jing Wang, Jacob Haag,Osman El Atwani,Timothy G. Lach,Mychailo Toloczko

JOURNAL OF NUCLEAR MATERIALS（2025）

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关键词

Flash electropolishing,Focused ion beam preparation,Radiation effects,STEM/TEM characterization,Black spot damage,Moire<acute accent> fringes,Surface dislocations,FeCr alloys

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