An Improved Electro-Thermal Model for GaN Gate Injection Transistor
2024 IEEE Design Methodologies Conference (DMC)（2024）
关键词
Gallium Nitride (GaN),Gate Injection Transistor (GIT),electro-thermal model,power semiconductor device characterization,power semiconductor device modelling
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要