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Post-Fab Laser Trimming: Increasing Yield and Lowering Power Consumption of PICs

Simon Duval,Philippe Lassonde,François Légaré, Ignazio Piacentini, Louis-Rafaël Robichaud

2024 IEEE CPMT Symposium Japan (ICSJ)(2024)

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关键词
Laser trimming,Mid-IR lasers,MZI (Mach Zhender Interferometers),MRR (Micro Ring Resonators),CPO (Co-Packaged Optics),Photonic Integrated Circuits (PIC),WLT (Wafer Level Testing)
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