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Efficient Nonlinear Resist Modeling by Combining and Cascading Quadratic Wiener Systems

Chunxiao Mu, Lei Cheng, Song Zhang,Hao Jiang, David H. Wei, Yanlong Sun,Jinlong Zhu,Shiyuan Liu

OPTICS AND LASER TECHNOLOGY(2025)

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Key words
OPC,Computational lithography,Nonlinear resist system modeling,Performance optimization,Model calibration method
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