A Statistical and Modeling Study on the Effects of Radiation on Au/Ta/ZrO2(Y)/Pt/Ti Memristive Devices

D. Maldonado,A. Cantudo,D. V. Guseinov,M. N. Koryazhkina,E. V. Okulich, D. I. Tetelbaum, N. O. Bartev, N. G. Danchenko, V. A. Pikar, A. V. Teterevkov,F. Jimenez-Molinos,A. N. Mikhaylov, J. B. Roldan

CHAOS SOLITONS & FRACTALS（2025）

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关键词

Memristor,Resistive switching,RRAM,Variability,Radiation tolerance,Modeling,Statistical analysis

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