Testbeam Characterization of a SiGe BiCMOS Monolithic Silicon Pixel Detector with Internal Gain Layer
L. Paolozzi,M. Milanesio,T. Moretti,R. Cardella,T. Kugathasan,A. Picardi,M. Elviretti,H. Rücker,F. Cadoux,R. Cardarelli,L. Cecconi,S. Débieux,Y. Favre,C. A. Fenoglio,D. Ferrere,S. Gonzalez-Sevilla,L. Iodice,R. Kotitsa,C. Magliocca,M. Nessi,A. Pizarro-Medina,J. Saidi,M. Vicente Barreto Pinto,S. Zambito,G. Iacobucci arxiv（2024）
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