Analysis of Threshold Voltage Options on Flip-Flop SEU Performance at GF 12-Nm FinFET Node

Jiesi Xing,Christopher J. Elash, Peiman Pour Momen, Dylan Lambert, Jaime Cardenas Chavez,Shi-Jie Wen,Rita Fung,Li Chen

2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC)（2024）

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关键词

Flip-flop (FF),Cross-section,FinFET,single event upset,threshold voltage,soft-error rate

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