Single Event Upset Characterization of Microsemi RISC-V Softcore Processors on Polarfire MPF300T-1FCG1152E FPGA Using Proton Irradiation
2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC)（2024）
关键词
Single event upset,Proton irradiation,RISC-V,Polarfire,FPGA
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