NanoSQUIDs with Proximity Effect Nanobridge Josephson Junctions for Future Applications in Electron Microscopy
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY（2025）
Key words
Films,Transmission electron microscopy,Substrates,Superconducting transition temperature,Spatial resolution,Silicon,Josephson junctions,Type II superconductors,Resists,Nanostructures,Electron beam lithography,Josephson devices,proximity effect,sputtering,SQUIDs,transmission electron microscope
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