Comprehensive Short Circuit Behavior and Failure Analysis of 1.2kv SiC MOSFETs Across Multiple Vendors and Generations
IEEE ACCESS（2024）
Key words
Failure mechanisms,short-circuit (SC) robustness,silicon carbide (SiC) MOSFETs,SiC planar MOSFET,SiC trench MOSFET,SiC MOSFET generations
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