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TCAD-Based Design of SiGe HBT Germanium Profiles Via Bayesian Optimization

Justin P. Heimerl,Jeffrey W. Teng,Harrison P. Lee,Delgermaa Nergui,Jackson P. Moody,John D. Cressler

BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium（2024）

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Key words
Bayesian Optimization,SiGe HBT,Germanium Profile,Device Optimization,Automatic Design,TCAD
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