Total-Ionizing-Dose Effects in Integrated Silicon Phase Shifters Using Localized X-Ray Pulses

Mozhgan Hosseinzadeh,Jeffrey W. Teng,Brett L. Ringel, Peter J. Francis,Justin P. Heimerl,George N. Tzintzarov,Arielle Little,Jeremy P. Bonsall,Stephen D. LaLumondiere,Daniele M. Monahan,John D. Cressler

IEEE Transactions on Nuclear Science（2024）

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Key words

Integrated Silicon Photonics (SiPh),radiation effects,Total Ionizing Dose (TID),Mach-Zehnder modulator (MZM),Phase Shifter,Radiation-Induced Attenuation (RIA),Radiation-Induced Refractive Index Change (RIRIC),Band-to-Band Optical Absorption

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