Investigation of BPD Faulting under Extreme Carrier Injection in Room Vs High Temperature Implanted 3.3kv SiC MOSFETs
Defect and diffusion forum/Diffusion and defect data, solid state data Part A, Defect and diffusion forum（2024）
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要