Component Analysis of a 25-Cell Stack Following 6.7 Kh of High Temperature Electrolysis

J. Aicart,K. Couturier,M. Hubert,K. Vulliez, M. Elie, L. Champelovier, N. Giacometti,M. Petitjean,B. Morel, B. Gonzalez, M. Prioux, K. Henault,S. Di Iorio,A. Laplace, J. G. Begos, C. Vallat, R. Moles, T. David, T. L. Lai,J. Laurencin

INTERNATIONAL JOURNAL OF HYDROGEN ENERGY（2024）

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Key words

Electrolysis,Durability,Interconnect,Post-mortem analysis,Sealing,Solid oxide electrolysis,Stack

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