Measurement of Neutron-induced Single Event Upset Cross-Section of UltraScale Kintex FPGA Using Time-of-Flight Technique
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
关键词
Neutrons,Field programmable gate arrays,Atmospheric measurements,Single event upsets,Semiconductor device measurement,Radiation effects,Protons,Energy measurement,Random access memory,Particle measurements,Cross section,neutron,single-event upset (SEU),time of flight (TOF),UltraScale Kintex FPGA
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