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AI-Driven Digital Twin for Health Monitoring of Wide Band Gap Power Semiconductors

Alireza Mehrabi, Keyvan Yari,Willem D. Van Driel,Rene H. Poelma

2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC)(2024)

Cited 0|Views3
Key words
AI,Digital twin,Health monitoring,Kalman filter,NARX-ANN,Power converter,WBG semiconductor
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