Rapid On-Wafer Quality Screening of AlGaN/GaN Superlattice Castellated Field Effect Transistors Using Short-Term Stress and Electroluminescence
IEEE ELECTRON DEVICE LETTERS（2024）
Key words
Breakdown voltage (BV),electroluminescence (EL),hot electrons,step-stress,super-lattice castellated field effect transistors (SLCFETs)
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