Defect Characterization by Electron Paramagnetic Resonance in 4H-Sic Irradiated by Low Fluence Rate Alpha Particles
HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS XXVI（2024）
关键词
4H-SiC,Electron paramagnetic resonance,Schottky barrier diodes,Alpha irradiation,g-values,Angular dependent,Vacancies
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要