Charge Trapping Gate Stack Enabled Non-Recessed Normally off AlGaN/GaN HEMT with High Threshold Voltage StabilityKangyao Wen,Jiaqi He,Yang Jiang,Fangzhou Du,Chenkai Deng,Peiran Wang,Chuying Tang,Wenmao Li,Qiaoyu Hu, Yuhan Sun,Qing Wang,Yulong Jiang,Hongyu YuAPPLIED PHYSICS LETTERS（2024）引用 0|浏览8AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
