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Impact of Memory Hierarchy on Memory Encryption Performance

Viktor V. Prutyanov, Mikhail Y. Romashikhin, Yan Vugenfirer,Roman A. Solovyev,Aleksandr Y. Romanov

IEEE ACCESS(2024)

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Key words
Random access memory,Metadata,Encryption,Benchmark testing,Performance evaluation,Embedded systems,Field programmable gate arrays,Clocks,Authentication,System-on-chip,Authentication tree,embedded systems,experimental evaluation,memory encryption
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