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Investigating the Trade-off Between BV Stability and ESD Robustness in the N-Channel LDMOS Devices

Hailian Liang, Liping Li,Junliang Liu,Feng Lin,Chaoqi Xu, Jun Sun,Xiaofeng Gu

SEMICONDUCTOR SCIENCE AND TECHNOLOGY（2024）

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关键词
BV stability,ESD robustness,HCI stress and trade-off
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