A Count-Rate Recovery Method for Photon Counting X-ray Detectors Using Scintillator/SiPM

Y. Li, X. Wang, W. Liu, R. Chen, D. Zhang, X. Zhang, N. Jiang,N. D’ Ascenzo, B. Li,D. Xi,Q. Xie

2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)（2024）

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Key words

Photon Counting,Dead Time,Image Artifacts,Single-photon Detectors,Fluoroscopic Images,Scintillation Detector,Streak Artifacts

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