Analysis and Modeling of DC-IV and Flicker Noise Characteristics of 180-Nm Bulk Planar NFETs at Cryogenic Temperatures
10TH INTERNATIONAL CONFERENCE ON ELECTRONICS, COMPUTING AND COMMUNICATION TECHNOLOGIES, CONECCT 2024（2024）
Key words
BSIM Modeling,Bulk MOSFETs,Cryogenic Temperatures,Flicker Noise
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