An ANN-Aided Parameter Design Method for CLLC-Type DAB Converters Considering Parameter Perturbation
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS（2024）
关键词
Design methodology,Probability density function,Data processing,Manufacturing,Voltage,Mass production,Magnetic resonance,Artificial neural network (ANN),batch-normalization,CLLC-type dual active bridge (DAB),data-driven model,Monte Carlo
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