Characterization of Two-Dimensional Materials Using Ultrafast Spectroscopy and Imaging
2024 Conference on Lasers and Electro-Optics (CLEO)（2024）
Key words
Ultrafast Spectroscopy,Sampling Time,Raman Spectroscopy,Atomic Force Microscopy,Photoluminescence,Independent Component Analysis,Hyperspectral,Exciton,Decay Time,Changes In Samples,Quantum Information,Transition Metal Dichalcogenides,Atomic Force Microscopy Measurements,Ellipsometry,Molecular Beam Epitaxy,Monolayer Transition Metal Dichalcogenides,Four-wave Mixing,Change In Dipole Moment,Spectral Points
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