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Towards an EPR on a Chip Spectrometer for Monitoring Radiation Damage During X-ray Absorption Spectroscopy

Ekaterina Shabratova,Hadi Lotfi,Ayman Sakr,Mohamed Atef Hassan,Michal Kern, Matthias Neeb, René Grüneberger,Bastian Klemke, Gianluca Marcozzi,Klaus Kiefer,Aleksei Tsarapkin,Katja Höflich,Alina Dittwald,Andrea Denker,Jens Anders,Joseph E. McPeak,Klaus Lips

Applied Magnetic Resonance（2024）

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