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Characterization of Bulk Trap Density Using Fully I-V-based Optoelectronic Differential Ideality Factor in Multi-Layer MoS2 FETs

Soyeon Kim,Jaewook Yoo,Seohyeon Park,Hongseung Lee, Hyeonjun Song,Seongbin Lim, Minah Park,Choong-Ki Kim,TaeWan Kim,Bongjoong Kim,Hagyoul Bae

JOURNAL OF PHYSICS D-APPLIED PHYSICS（2024）

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Key words
2D materials,molybdenum disulfide (MoS2),sub-bandgap optical illumination,bulk trap (D-bulk),differential ideality factor
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