Design Consideration for Full Well Capacity and Charge Transfer Efficiency of a CCD-in-CMOS Imager Pixel: TCAD Study
X-RAY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY XI（2024）
关键词
CCDs,CCD-in-CMOS,time delayed integration (TDI),full well capacity (FWC),charge transfer efficiency (CTE),TCAD,Detector
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要