State-Independent Low Resistance Drift SiSbTe Phase Change Memory for Analog In-Memory Computing Applications

H. Y. Cheng, Z. L. Liu, A. Majumdar, Alexander Grun,A. Ray, J. Su,Malte J. Rasch,Fabio Carta,Lynne M. Gignac,C. Lavoie,C. W. Cheng, M. Bright Sky,H. L. Lung

Symposium on VLSI Technology（2024）

引用 1|浏览3

关键词

Computational Memory,Resistance Drift,Data Retention,Hardware Accelerators,Deep Neural Network,Levels Of Resistance,Inference Accuracy,Drift Coefficient

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要