Hybrid P-Gan/mis Gate HEMT Suppressing Drain-Induced Dynamic Threshold Voltage Instability

Chen Wang,Jinyan Wang,Xin Wang,Ziheng Liu,Jiayin He, Ju Gao, Chengkang Ao,Maojun Wang,Jin Wei

IEEE ELECTRON DEVICE LETTERS（2024）

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Key words

E-mode,Schottky-type p-GaN gate HEMT,MIS-gate HEMT,V-th instability,drain-induced dynamic V-th shift,E-mode,Schottky-type p-GaN gate HEMT,MIS-gate HEMT

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