Laser Beam Induced Current for Defect Concentration and Aging Analysis of Broad Area Laser Diodes

E. McVay,R.J. Deri,D. Mittelberger,W.E. Fenwick,S. Baxamusa,M.C. Boisselle, J. Li, J. Varley, R. Swertfeger,L. Gilmore,M. Crowley,P. Thiagarajan,J. Song,G. Thaler

2024 Conference on Lasers and Electro-Optics (CLEO)（2024）

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Key words

Diode Laser,Defect Concentration,Performance Metrics,Waveguide,Optical Axis,Point Of Failure,Department Of Energy,Central Cavity,Current Threshold,Molecular Beam Epitaxy,Antireflection,Non-radiative Recombination,Cavity Length,Course Of Aging,Transimpedance Amplifier,Power Drop,Eurofins Scientific

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