A New Method for Extracting Parasitic Capacitance of MOSFET in a Half-Bridge Configuration

2024 IEEE International Symposium on Electromagnetic Compatibility, Signal &ampamp Power Integrity (EMC+SIPI)（2024）

引用 0|浏览3

关键词

Metal-oxide-semiconductor field effect transistor (MOSFET),silicon carbide (SiC),parasitic capacitance,half-bride configuration

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要