High-Performance TiN/TaOx/TiN Selectors WithShort-Term Memory Characteristics
IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）
关键词
Tin,Resistance,Switches,Tunneling,Stress,Performance evaluation,Programming,Fowler-Nordheim (FN) tunneling,selector,short-term memory (STM),varistor,Zener diode
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要