High-Performance Error and Erasure Decoding with Low Complexities Using SPC-RS Concatenated Codes
IEEE Trans Very Large Scale Integr Syst（2025）
关键词
Coding gain,error and erasure decoding (EED),low complexity,Reed-Solomon (RS) codes,single parity check (SPC),Coding gain,error and erasure decoding (EED),low complexity,Reed-Solomon (RS) codes,single parity check (SPC)
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