Symmetry and Planar Chirality Measured with a Log-Polar Transformation in a Transmission Electron MicroscopeA. H. Tavabi,P. Rosi,R. B. G. Ravelli,A. Gijsbers,E. Rotunno, T. Guner, Y. Zhang,A. Roncaglia,L. Belsito,G. Pozzi,T. Denneulin,G. C. Gazzadi, M. Ghosh, R. Nijland,S. Frabboni, P. J. Peters,E. Karimi,P. Tiemeijer,R. E. Dunin-Borkowski,V. GrilloPHYSICAL REVIEW APPLIED（2024）引用 1|浏览11AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
