Quantifying Defect-Mediated Electron Capture and Emission in Flexible Monolayer WS2 Field-Effect Transistors

J. A. Yang,Eros Reato,Theresia Knobloch, J.-S. Ko, Z. Zhang,Andrew J. Mannix,Krishna Saraswat,Tibor Grasser,Max Christian Lemme,Eric Pop

Device Research Conference（2024）

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关键词

Electronic Capture,Dynamic Process,Trapping,Previous Efforts,Semiconductor Devices,Gate Dielectric,Time-dependent Measurements,Chemical Vapor Deposition,Conduction Band,Electron Beam Evaporation,Atomic Layer Deposition,Polyethylene Naphthalate,Forward Sweep,Subthreshold Slope

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