Time Performance of Analog Pixel Test Structures with In-Chip Operational Amplifier Implemented in 65 Nm CMOS Imaging Process
Gianluca Aglieri Rinella, Luca Aglietta,Matias Antonelli, Francesco Barile,Franco Benotto,Stefania Maria Beole, Elena Botta,Giuseppe Eugenio Bruno,Francesca Carnesecchi, Domenico Colella, Angelo Colelli,Giacomo Contin,Giuseppe De Robertis, Floarea Dumitrache,Domenico Elia,Chiara Ferrero, Martin Fransen,Alex Kluge, Shyam Kumar, Corentin Lemoine,Francesco Licciulli, Bong-Hwi Lim, Flavio Loddo,Magnus Mager,Davide Marras,Paolo Martinengo,Cosimo Pastore, Rajendra Nath Patra,Stefania Perciballi,Francesco Piro,Francesco Prino,Luciano Ramello, Arianna Grisel Torres Ramos,Felix Reidt, Roberto Russo,Valerio Sarritzu,Umberto Savino, David Schledewitz, Mariia Selina,Serhiy Senyukov,Mario Sitta,Walter Snoeys,Jory Sonneveld,Miljenko Suljic, Triloki, Andrea Turcato NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT（2025）
关键词
Monolithic active pixel sensors,Solid state detectors,Silicon,CMOS,Particle detection,Test beam
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