Accessing D-D Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELSMatthieu Bugnet,Khalil El Hajraoui,Adam Kerrigan,Vlado K Lazarov,Guillaume Radtke,Quentin M Ramasse, Demie KepatsoglouMicroscopy and Microanalysis（2024）引用 0|浏览3AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
