De-Embedding Methodology to Characterize Linearity of Active Filters under Process Variations
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS（2024）
Key words
Filters,Linearity,Baluns,Topology,Accuracy,Semiconductor device measurement,Band-pass filters,Passband,Control systems,Very large scale integration,Active filter,buffer,de-embedding,integrated circuits,process corners,third-order intercept point
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