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A Novel GaN Gate Driver: Transistor-Intrinsic Integration Exploiting Non-Ideal Characteristics by Device-Circuit Co-Design

Fangqing Li, Xinyu Sun,Haodong Wang,Xin Chen,Yaozong Zhong,Hongwei Gao,Haoran Qie,Yunzhe Cao,Gaofei Zhi, Xinkun Zhang,Xiaolu Guo, Yu Zhou,Qian Sun,Hui Yang

2024 36TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND IC S, ISPSD 2024（2024）

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Key words
transistor-intrinsic integration,gate driver,charge pump,device-circuit co-design,rail-to-rail output
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