Defect Density and Atomic Defect Recognition in the Middle Layer of a Trilayer MoS2 Stack
NANO LETTERS（2024）
关键词
Few-layer MoS2,Sulfur vacancy,Defect recognition,damage cross-section,low-voltageC(C)/C-S-corrected HRTEM,FIB cross-section
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要