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Defect-Driven Configurational Entropy in the High-Entropy Oxide Li1.5MO3-δ

Zachary R. Mansley,Cynthia Huang,Jessica Luo, Patrick Barry,Armando Rodriguez-Campos,Marie F. Millares,Zhongling Wang,Lu Ma,Steven N. Ehrlich,Esther S. Takeuchi,Amy C. Marschilok,Shan Yan,Kenneth J. Takeuchi,Yimei Zhu

Nano Letters（2024）

Cited 2|Views5
Key words
high entropy,electron microscopy,defects,battery,layered oxide
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