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Vulnerability evaluation on 16 nm FinFET Ultrascale plus MPSoC using fault injection and proton irradiation

Yonghong Li,Weitao Yang,Maocheng Wang,Yang Li,Yaxin Guo,Pei Li,Haoyu Zhao,Chaohui He, Di Wang, Ye Yang,Xiaodong Zhang,Heng An

MICROELECTRONICS RELIABILITY（2022）

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Key words
Ultrascale plus MPSoC,Vulnerability,Dynamic partial reconfiguration,Fault injection,Proton irradiation
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