Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
IEEE Transactions on Nuclear Science（2024）
关键词
CERN high-energy accelerator mixed-field (CHARM) facility,ChipIr,radiation hardness assurance (RHA),singe-event effect (SEE),system observability,system-level test,CERN high-energy accelerator mixed-field (CHARM) facility,ChipIr,radiation hardness assurance (RHA),singe-event effect (SEE),system observability,system-level test
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