Toward a Universal Characterization Methodology for Conversion Gain Measurement of CMOS APS: Application to Euclid and SVOM
X-RAY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY XI（2024）
关键词
Euclid,NISP,SVOM,CAGIRE,ALFA,IR detectors,H2RG,conversion gain,interpixel capacitance,IPC,non linearity,correlations
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