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A Simplified Method for RTN Assessment and Novel Understanding on AC RTN

Chenyang Zhang, Yu Xiao,Yongkang Xue, Da Wang,Pengpeng Ren,Zhigang Ji

2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA(2024)

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Key words
Random telegraph noise,bias temperature instability,discharge-based multi-pulse technique,dual-point technique
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