Cryogenic Characterization of Low-Frequency Noise in 40-Nm CMOS
IEEE Journal of the Electron Devices Society（2024）
关键词
Cryogenics,Noise,MOS devices,Transistors,Systematics,Temperature distribution,Geometry,Low frequency noise,1/f noise,flicker noise,cryogenic electronics,Cryo-CMOS,quantum computing
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